Acta Metallurgica Sinica (English Letters) ›› 1992, Vol. 5 ›› Issue (12): 457-461.

• Research paper • Previous Articles     Next Articles

A METHOD FOR CORRECTING INTENSITY IN CONTINU-OUS SCANNING X-RAY STRESS MEASUREMENT

LI Jiabao;HANG Zengqiao National Laboratory for Fatigue and Fracture of Materials,Institute of Metal Research,Academia Simca.Shenyang,China HE Jiawen Xi'an Jiaotong University,Xi'an,China   

  • Received:1992-12-11 Revised:1992-12-11 Online:1992-12-11 Published:2009-10-10

Abstract: A set of absorption curves was priorly prepared on transparent films to fit the background and peak intensities in continuous scanning X-ray stress measurement.It may be better to correct both background and absorption of pure diffraction intensity.Experimental results revealed this to be a reliable correction method.

Key words: X-ray diffraction, stress measurement, intensity correction, peak location