Anisotropic Electroplastic Effects on the Mechanical Properties of a Nano-Lamellar Austenitic Stainless Steel

doi:10.1007/s40195-020-01130-z

Abstract

Abstract:

Effects of electropulsing treatment (EPT) on the microstructural evolution and mechanical properties of a cold-rolled 316L austenitic stainless steel with nano-lamellar structure were investigated. The EPT experiments were carried out with the electric current direction along the rolling direction (RD) and the transverse direction (TD) of the samples, respectively. Significant anisotropic electroplastic effects for the RD and TD specimens, i.e., reduced hardness/strength and enhanced ductility, were obtained owing to the different recrystallization behaviors of the RD and TD specimens during EPT. The RD specimens after EPT with larger recrystallized grain size and higher volume fraction of recrystallization show lower strength and higher elongation than that of the TD specimens. The main reason might be attributed to the change of the current direction in the two kinds of samples, which results in the different sensitivity of the microstructures to thermal and athermal effects during EPT.

Key words: Stainless steel, Electroplastic effect, Electropulsing, Recrystallization, Anisotropy, Strength, Plasticity

Y. R. Ma, H. J. Yang, D. D. Ben, X. H. Shao, Y. Z. Tian, Q. Wang, Z. F. Zhang. Anisotropic Electroplastic Effects on the Mechanical Properties of a Nano-Lamellar Austenitic Stainless Steel[J]. Acta Metallurgica Sinica (English Letters), 2021, 34(4): 534-542.

Figures/Tables 10

Fig. 1 Schematic diagram of the orientation of the CR-316L SS specimens a samples processed by EPT b

Fig. 2 Typical bright-field TEM images of the CR-316L SS samples after EPT with different discharge voltages: a RD, b RD-EPT12 kV, c RD-EPT13 kV, d TD, e TD-EPT12 kV ,f TD-EPT13 kV

Fig. 3 Microhardness evolution of the CR-316L SS samples after EPT with different discharge voltages

Fig. 4 Tensile engineering stress-strain curves of the CR-316L SS samples after EPT with different discharge voltages

Table 1 Strength and elongation of CR-316L SS before and after EPT

Voltage (kV)	RD		TD
Voltage (kV)	Yield strength (MPa)	Elongation to failure (%)	Yield strength (MPa)	Elongation to failure (%)
0	1417	6.7	1533	7.3
12	1291	13.2	1505	8.5
13	1046	17.2	1292	12.0

Fig. 5 Percentage change ratio of strength a and elongation b of CR-316L SS after EPT with different discharge voltages

Fig. 6 Strength-ductility balance of the CR-316L SS after EPT

Fig. 7 Schematic diagram of typical lamellar microstructure of the CR-316L SS a, and EPT-induced electron motion in the RD b and TD samples c

Fig. 8 Profuse dislocations distributed inside the lamellar grains and located at boundaries in the CR-316L SS sample a, educed dislocation density inside the lamellar grains while some dislocations tangled at lamellar boundaries as indicated by the red arrows in the RD-EPT12 kV sample b

Fig. 9 XRD profiles of RD and TD samples treated by EPT with different discharge voltages

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