Fig. 1 a EBSD inverse pole figure (IPF) map of solid-solution-treated WE43 plate; b schematic illustration showing samples I, II and III machined from solid-solution-treated WE43 plate for cold rolling; c-e (0001) pole figures of samples I, II and III, respectively

Fig. 2 a, e, i EBSD IPF maps containing (0001) pole figures; b, f, j kernel average misorientation (KAM) maps; c, g, k band contrast (BC) maps including three kinds of twin boundaries: {10-12} extension twin boundaries marked by red lines, {10-11} contraction twin boundaries labeled by green lines, and {10-11}-{10-12} double twin boundaries highlighted by blue lines; d, h, l rotation axis and misorientation distribution maps of cold-rolled samples I, II and III, respectively

Fig. 3 EBSD IPF maps of cold-rolled samples I, II and III subjected to annealing for 2, 30 and 60 min, respectively. Recrystallized grains are highlighted by bright colors, and their number fractions and average grain sizes are also measured

Fig. 4 a Number fractions and b average grain sizes of recrystallized grains as functions of annealing time ($\mathrm{log}{t}_{\mathrm{min}}$) in cold-rolled samples I, II and III during annealing

Fig. 5 (0001) and (10-10) pole figures of recrystallized grains from in Fig. 2 in cold-rolled samples I, II and III subjected to annealing for 2, 30 and 60 min, respectively

Fig. 6 Twin-induced and GB-induced SRX behaviors of cold-rolled sample II during annealing for 2 min: a, d EBSD IPF maps from Fig. 3b showing SRX nucleation features inside twins and at trigeminal grain boundaries, respectively; b, e KAM maps corresponding to (a, d), respectively; c, f (0001) pole figures of recrystallized grains labeled in (b, e), respectively

Fig. 7 a–c Number fractions and d–f average grain sizes of four texture components including TCA, TCB, TCC and TCD of recrystallized grains as a function of annealing time ($\mathrm{log}{t}_{\mathrm{min}}$) in cold-rolled samples I, II and III during annealing, respectively

Fig. 8 EBSD IPF maps of cold-rolled samples I, II and III subjected to annealing for 120, 240 and 720 min, respectively. Average grain sizes of recrystallized grains are also measured

Fig. 9 Average grain sizes in cold-rolled samples I, II and III after full recrystallization as a function of annealing time (${t}_{\mathrm{min}}$) a and annealing time ($\mathrm{log}{t}_{\mathrm{min}}$) b

Fig. 10 a A schematic for illustrating the interactions of precipitation and recrystallization during annealing, adapted from Ref. [27]; b-d SEM images of cold-rolled, 30-min-annealed and 720-min-annealed sample I corresponding to positions b, c and d in a, respectively; e-g high-magnified SEM images corresponding to positions e, f and g in c, respectively

Fig. 11 (0001) and (10-10) pole figures of recrystallized grains in cold-rolled samples I, II and III subjected to annealing for 120, 240 and 720 min, respectively

Fig. 12 a–c Number fractions and d–f average grain sizes of four texture components including TCA, TCB, TCC and TCD of recrystallized grains as a function of annealing time ($\mathrm{log}{t}_{\mathrm{min}}$) in cold-rolled samples I, II and III after full recrystallization, respectively

Fig. 13 SRX nucleation kinetics of cold-rolled samples I, II and III during annealing: a–c Vickers hardness values as a function of annealing time ($\mathrm{log}{t}_{\mathrm{min}}$) at different annealing temperatures; d–f fractional softening ${X}_{\rm{H}}$ values as a function of annealing time ($\mathrm{log}{t}_{\mathrm{min}}$) at different annealing temperatures; g–i $\mathrm{lnln}(1/(1-{X}_{\rm{H}}))$ values as a function of annealing time ($\mathrm{ln}t$) at different annealing temperatures; j–l$\mathrm{ln}(1/{t}_{\mathrm{R}})$ values as a function of $1/T$ in cold-rolled samples I, II and III during annealing, respectively

Fig. 14 SRX growth kinetics of cold-rolled samples I, II and III after full recrystallization: a–c average grain sizes as a function of annealing time ($\mathrm{log}{t}_{s}$) at different annealing temperatures; d–f $\mathrm{ln}\left(\mathrm{d}D/\mathrm{d}t\right)$ values as a function of $\mathrm{ln}D$ at different annealing temperatures; g–i $\mathrm{ln}k$ values as a function of $1/T$ in cold-rolled samples I, II and III after full recrystallization, respectively