Additive Manufacturing of Nickel-Based Superalloy Single Crystals with IN-738 Alloy

doi:10.1007/s40195-021-01320-3

Abstract

Abstract:

The production of non-weldable nickel-based superalloys, especially single-crystal superalloys, is important for additive manufacturing. Single-crystal specimens of non-weldable nickel-based superalloys were produced by electron beam selective melting using an IN-738 alloy. In this study, single-crystal nickel-based superalloy specimens of different sizes were prepared by a multiple preheating process and tight control of the melting parameters without the need for a grain selector or single-crystal seed for the first time. Electron backscattered diffraction measurements were performed to confirm the presence of a single crystal. The transition boundaries between the polycrystalline and single-crystal regions at the edges and bottom of the samples were characterized to analyze the formation of single crystals.

Key words: Non-weldable superalloys, Electron beam selective melting, Single crystal, Grain selection

Yang Li, Ye-Feng Yu, Zhi-Bin Wang, Xiao-Yu Liang, Wen-Bin Kan, Feng Lin. Additive Manufacturing of Nickel-Based Superalloy Single Crystals with IN-738 Alloy[J]. Acta Metallurgica Sinica (English Letters), 2022, 35(3): 369-374.

Figures/Tables 6

Table 1 IN738LC alloy powder composition (wt%)

Ni	Ti	Al	Co	Cr	C	Fe	Zr	Nb	Ta	Mo	Si	B	W	Mn
Bal.	3.39	3.61	8.57	15.92	0.11	0.16	0.019	0.93	1.85	1.86	0.038	0.0077	2.75	0.013

Table 2 Process parameters

Gun accelerating voltage (kV)	Line offset (mm)	Layer thickness (μm)	Beam power (W)	Area energy density (J/mm²)	Scanning speed (m/s)	Focus offset (mA)	Controlling model of scan speed	Preheating temperature (°C)	Line order	Support
60	0.1	70	300-1800	6	0.5-3	12-20	Constant	1050	1	None

Fig. 1 Scanning strategy and stereoscopic photos of the crack-free specimens: a scanning strategy; b S1, v = 3 m/s; c S1, v = 2 m/s; d S1, v = 1 m/s; e S1, v = 0.6 m/s; f S2, v = 0.8 m/s; g S2, v = 0.7 m/s

Fig. 2 EBSD of region 1 (Fig. 1f): a IPF-X map, b IPF-Y map, c IPF-Z map, d (001), (011) and (111) texture plots figures

Fig. 3 EBSD of region 2 (Fig. 1f): a IPF-X map, b IPF-Y map, c IPF-Z map, IPF-Z map with 15° d, 2° e of misorientation

Fig. 4 PDAS of the samples: a OM of Fig. 1e about 15 μm, b OM of Fig. 1f about 15 μm, c SEM of Fig. 1e, d high magnifications SEM of Fig. 1e

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