Dislocation Source and Pile-up in a Twinning-induced Plasticity Steel at High-Cycle Fatigue

doi:10.1007/s40195-020-01176-z

Abstract

Abstract:

Dislocation behaviour of a twinning-induced plasticity (TWIP) steel subjected to high-cycle fatigue tests is investigated in the present study. Grain boundaries are the important sources of dislocation generation during fatigue tests, contributing to the increase in dislocation density. Continuous emission of dislocations from grain boundaries is observed in many grains. Inclusions can sustain large dislocation pile-ups at the inclusion interfaces, leading to a high stress concentration and therefore acting as potential sites of microcrack nucleation. In contrast, annealing twin boundaries are relatively weak boundaries for dislocation pile-ups. When the number of dislocations in a pile-up is large, dislocations can crossover twin boundaries and glide inside the annealing twins. The stress concentration at the twin boundary is relatively low so that twin boundaries could not act as the sites for microcrack initiation.

Key words: Dislocation source, Grain boundary, Twin boundary, Fatigue, Inclusion

Rendong Liu, Zhiyuan Liang, Li Lin, Mingxin Huang. Dislocation Source and Pile-up in a Twinning-induced Plasticity Steel at High-Cycle Fatigue[J]. Acta Metallurgica Sinica (English Letters), 2021, 34(2): 169-173.

Figures/Tables 4

Fig. 1 a EBSD band contrast figure and b the corresponding inversed pole figure of the initial microstructure of the TWIP steel. Red lines represent the annealing twin boundaries

Fig. 2 a Dislocations emitted from two dislocation sources at one grain boundary; b dislocations emitted from different grain boundaries glide at two different slip systems; there is a dislocation pile-up at the interface of the inclusion indicated by the red arrow; c dislocations emitted from one dislocation source; d dislocations emitted from two dislocation sources at one grain boundary

Fig. 3 Dislocations piled up at and crossover the annealing twin boundary, indicated by the white arrows

Fig. 4 a Dislocation cells in the grain interior, showing that typical cell size is smaller than one micron, b an enlarged view of the dislocation cells and c dislocation junctions indicated by the white arrows

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