Abstract:

The significant occupancy of {411}<148> texture exists in the thin-gauge grain-oriented silicon steel (TG-CRGO is defined that thickness of the sheet is <0.25 mm and the reduction in cold rolling is more than 90%) which has been considered to have obviously effects on the abnormal growth of Goss-oriented grains during the secondary recrystallization process. The microstructures of the TG-CRGO were investigated by X-ray diffraction and electron back-scattered diffraction in this study. It was found that {411}<148> texture mainly exists in the center layer of hot-rolled as well as normalized plates. With the increase in cold rolling reduction, {411}<148> orientation gradually rotates to α-fiber texture (<110>//RD). Finally, few {411}<148> would retain at the boundaries of deformed α-fiber grains (<110>//RD) as the reduction in cold rolling reaches 90%. After annealing treatment, a small amount of γ-fiber textures (<111>//ND) preferably nucleates and recrystallizes between the DBs (deformation bands) at first; then, the {411}<148> recrystallization texture occurs and mainly nucleates at the grains boundaries of the deformed α-fiber grains, and also quite a few {411}<148> orientation grains nucleate in the inner of {112}<110> grains. But this phenomenon was not observed in the {100}<011> deformation grains. With respect to the occurrence of {411}<148> recrystallization texture, it is mainly induced by strong α-fiber as well as weak γ-fiber textures formed during cold rolling other than originating from {411}<148> regions in hot bands.

Key words: Thin-gauge grain-oriented silicon steel (TG-CRGO), {411}<148> texture, α-Fiber texture, Recrystallization, Electron back-scattered diffraction (EBSD)