Acta Metallurgica Sinica (English Letters) >
The effect of multilayer structure on magnetic properties of FePt thin films
Received date: 2008-03-17
Revised date: 2008-04-11
Online published: 2009-10-10
The Fe/Pt multilayer films with different structures were deposited by RF magnetron sputtering on glass substrates, and the L10-FePt films were obtained after theas-deposited samples were subjected to vacuum annealing at various temperatures. Results show that the Fe/Pt multilayer structure can effectively reduce the ordering temperature of FePt film, and the in-plane coercivity of [Fe (5.2 nm)/Pt (5.2 nm)]7 multilayers can reach 161.2 kA/m after annealed at 350 ℃ for 30 min. When Fe and Pt layer thickness is equal, the coercivity of the film is the largest. On the other hand, the different Fe-Pt crystalline phases such as Fe3Pt and FePt3 phases are formed after annealing when the thickness ratio of Fe/Pt deviates from 1 after annealing. When Fe and Pt have the same thickness, the thinner single layer gets the lower ordering temperature and the larger coercivity.
Kaifeng DONG , Xiaofei YANG , Junbing YAN , Weiming CHENG , Xiaomin CHENG . The effect of multilayer structure on magnetic properties of FePt thin films[J]. Acta Metallurgica Sinica (English Letters), 2009 , 22(1) : 22 -26 . DOI: 10.1016/S1006-7191(08)60066-6
[1] P.L. Lu and S.H. Charap, IEEE Trans Magn 31(1995)2767.
[2] P.L. Lu and S.H. Charap, IEEE Trans Magn 30(1994)4230.
[3] D. Weller and A. Moser, IEEE Trans Magn 35(1999)4423.
[4] Z.H. Qian and J.M. Sivertsen, J Appl Phys 83(1998)6825.
[5] T. Suzuki and K. Ouchi, IEEE Trans Magn 37(2001)1283.
[6] P.C. Kuo, S.C. Chen, Y.D. Yao, A.C. Sun and C.C. Chiang, J Appl Phys 91(2002)8638.
[7] T.Maeda, T. Kai, A. Kikitsu and T. Nagase, Appl Phys Lett 80(2002)2147.
[8] S.S. Kang, D.E. Nikles and J.W.Harrell, J Appl Phys 93(2003)7178.
[9] H.Y.Wang, W.H. Mao, X.K. Ma, H.Y. Zhang, Y.B. Chen, Y.J. He and E.Y.Jiang, J Appl Phys 95(2004)2564.
[10] Y.N. Hsu,S. Jeong, D.E. Laughlin and D.N. Lambeth, J Appl Phys 89(2001)7068.
[11] X.H. Xu, H.S. Wu, F. Wang and X.L. Li, Thin Solid Films 472(2005)222.
[12] S.C. Chen,P.C. Kuo, S.T. Kuo, A.C. Sun, C.Y. Chou and Y.H. Fang, IEEE Trans Magn 41(2005)915.
[13] F.T. Yuan, S.K. Chen, W.C. Chang and L. Horng, Appl Phys Lett 85(2004)3163.
[14] Z.L. Zhao, J. Ding, K. Inaba, J.S. Chen and J.P. Wang, Appl Phys Lett 83(2003)2196.
[15] Y. Endo, N. Kikuchi and O. Kitakami, J Appl Phys 89 (2001) 7065.
[16] D.H. Wei, S.C. Chou, T.S. Chin, C.C. Yu, Y. Liu and Y.D.Yao, J Appl Phys 97(2005)10N120.
[17] S.C.Chou, C.C. Yu, Y. Liou, Y. D. Yao, D.H. Wei, T.S. Chin and M.F. Tai, J Appl Phys 95(2004)7276.
[18] N. Zotov and A.SaVan, J Appl Phys 100(2006)073517.
[19] Y.Endo and K. Oikawa, J Appl Phys 94(2003)7222.
[20] D.J. Sellmyer, C.P. Luo, M.L. Yan and Y. Liu, IEEE Trans Magn 37(2001)1286.
[21] R. Hayn and V.Drchal, Phys Rev B 58 (1998) 4341.
[22] M. Matsushita, Y. Miyoshi, S. Endo and F. Ono, Phys Rev B 72(2005)214404.
[23] H. Kanazawa, G. Lauhoff and T. Suzuki, J Appl Phys 87(2000)6143.
[24] S. Okamoto, N.Kikuchi, O. Kitakami, T. Miyazaki, Y. Shimada and K. Fukamichi, Phys Rev B 66(2002)024413.
[25] Y.K. Takahashi, M.Ohnuma and K. Hono, J Magn Magn Mater 246(2002)259.
/
| 〈 |
|
〉 |
WeChat